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Journal Articles

NUMERICAL ANALYSIS OF TRANSIENT TEMPERATURE DISTRIBUTIONS DURING LASER SOLDERING

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J. Nicolics, G. Hobler
Journal: COMPEL - The international journal for computation and mathematics in electrical and electronic engineering
COMPEL (1994) 13 (4): 845–860.
https://doi.org/10.1108/eb051900
Published: 01 April 1994
View article titled, NUMERICAL ANALYSIS OF TRANSIENT TEMPERATURE DISTRIBUTIONS DURING LASER SOLDERING
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Journal Articles

EFFICIENT SIMULATION OF 3‐D STRESS DISTRIBUTIONS AT TRENCH STRUCTURES CAUSED BY THERMAL MISMATCH OF TRENCH FILLING AND SILICON SUBSTRATE

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R. Slehobr, G. Hobler
Journal: COMPEL - The international journal for computation and mathematics in electrical and electronic engineering
COMPEL (1994) 13 (4): 861–870.
https://doi.org/10.1108/eb051901
Published: 01 April 1994
View article titled, EFFICIENT SIMULATION OF 3‐D STRESS DISTRIBUTIONS AT TRENCH STRUCTURES CAUSED BY THERMAL MISMATCH OF TRENCH FILLING AND SILICON SUBSTRATE
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Journal Articles

THE EFFECT OF A SCREENING OXIDE ON ION IMPLANTATION STUDIED BY MONTE CARLO SIMULATIONS

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G. Hobler, H. Pötzl
Journal: COMPEL - The international journal for computation and mathematics in electrical and electronic engineering
COMPEL (1992) 11 (4): 403–411.
https://doi.org/10.1108/eb010101
Published: 01 April 1992
View article titled, THE EFFECT OF A SCREENING OXIDE ON ION IMPLANTATION STUDIED BY MONTE CARLO SIMULATIONS
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Journal Articles

AN EMPIRICAL MODEL FOR THE ELECTRONIC STOPPING OF BORON IN SILICON

Available to Purchase
G. Hobler, H. Pötzl, L. Palmetshofer, R. Schork, J. Lorenz, C. Tian, S. Gara, G. Stingeder
Journal: COMPEL - The international journal for computation and mathematics in electrical and electronic engineering
COMPEL (1991) 10 (4): 323–330.
https://doi.org/10.1108/eb051709
Published: 01 April 1991
View article titled, AN EMPIRICAL MODEL FOR THE ELECTRONIC STOPPING OF BORON IN SILICON
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