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An approach based on ANFIS and input selection procedure for microwave characterization of dielectric materials

Hakim Sadou, Tarik Hacib, Hulusi Acikgoz, Yann Le-Bihan, Olivier Meyer, Mohamed Rachid Mekideche

COMPEL (2018) 37 (2): 799–813.

https://doi.org/10.1108/COMPEL-05-2017-0208

Published: 05 March 2018

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