... of shielding effectiveness of nanostructured thin films can be important in many applications where there are electromagnetic compatibility problems. Originality/value The paper gives a valuable set of information for the characterization of nanometric copper thin films. The sputtering chamber...

... film. In additional, the theoretical equation for eddy current loss in an MPW is derived for ease of analysis. Findings The eddy current loss in an MPW is calculated as a function of the relative permeability and resistivity of its magnetic thin film to reduce the resistance due to the proximity...

...H. Ohsaki; Y. Ichiki; S. Sugita A numerical analysis tool has been developed to study electromagnetic characteristics of high‐temperature superconducting thin film used for a resistive‐type fault current limiter (FCL) and coated conductor. It adopts the finite element method based on current vector...