Skip to Main Content
D.K. Sharma
Close
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Journal Articles

Boundary scan based testing algorithm to detect interconnect faults in printed circuit boards

Available to Purchase
D.K. Sharma, R.K. Sharma, B.K. Kaushik, Pankaj Kumar
Journal: Circuit World
Circuit World (2011) 37 (3): 27–34.
https://doi.org/10.1108/03056121111155648
Published: 23 August 2011
View article titled, Boundary scan based testing algorithm to detect interconnect faults in printed circuit boards
Open the PDF for Boundary scan based testing algorithm to detect interconnect faults in printed circuit boards in another window
Add to Citation Manager for Boundary scan based testing algorithm to detect interconnect faults in printed circuit boards
This Feature Is Available To Subscribers Only

or Create an Account

Close Modal
Close Modal