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Keywords: Boundary scan
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Journal Articles
Journal:
Circuit World
Circuit World (2011) 37 (3): 27–34.
Published: 23 August 2011
...D.K. Sharma; R.K. Sharma; B.K. Kaushik; Pankaj Kumar Purpose This paper aims to address the various issues of board‐level (off‐chip) interconnects testing. A new algorithm based on the boundary scan architecture is developed to test off‐chip interconnect faults. The proposed algorithm can easily...
