The Properties of Thick Film Resistors Fabricated on Various Dielectric Layers

The paper presents a comparative analysis of the properties of ruthenate resistor layers produced on alumina substrates and on dielectric layers previously deposited on them. The effect of dielectric type and the peak firing temperature of ruthenate layers upon the value of their resistance and TCR (temperature coefficient of resistance) has been investigated. The reproducibility and stability of these parameters have been evaluated.