The appropriate selection of a testing method largely determines the accuracy of a measurement. Parasitic effects associated with test fixture demand a significant consideration in a measurement. The purpose of this paper is to introduce a measurement procedure which can be used for the characterization of surface mount devices (SMD) components, especially devoted to SMD inductors.
The paper describes measurement technique, characterization, and extracting parameters of SMD components for printed circuit board (PCB) applications. The commercially available components (multi‐layer chip SMD inductors in the ceramic body) are measured and characterized using a vector network analyzer E5071B and adaptation test fixture on PCB board. Measurement results strongly depend on the choice of the PCB; the behaviour of the component depends on the environment where the component is placed.
The equivalent circuit parameters are extracted in closed form, from an accurate measurement of the board‐mounted SMD inductor S‐parameters, without the necessity for cumbersome optimization procedures, which normally follow the radio frequency circuit synthesis.
It this paper, a new adaptation test fixture in PCB technology is realized. It is modeled and it has provided the extraction of parameters (intrinsic and extrinsic) of SMD inductor with great accuracy.
