The purpose of this paper is to experimental study for dual-channel-MCM reliability with complex conditions.
To investigate the temperature characteristics of multichip module (MCM), a highly integrated dual-channel MCM is tested, combining with the operating environment here.
The test results show that in receive-mode (RX) with high gain, the small-signal gain (S21) and the return loss (S11) all reduce by 4.14 and 2.01 dB while the temperature from −40 to 105 °C. Moreover, the output power (Pout) and Gain degrade by 1.64 and 5.68 dB with an input power (Pin) of −6 dBm and frequency (f) of 3.5 GHz, respectively. Likewise, in Rx with low gain and transmit-mode (TX), S11, S21, Pout and gain all exhibit progressive degradation as temperature increases. Leveraging the temperature testing, a temperature-compensation circuit is introduced at the MCM output to counteract thermal drift and guarantee stable operation across the full temperature range.
These findings provide critical design guidelines to ensure robust circuit operation across thermally dynamic environments.
