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Issue
1 April - Volume 15, Issue 1, Pages 6 - 42
1 August - Volume 15, Issue 2, Pages 6 - 38
1 December - Volume 15, Issue 3, Pages 7 - 48
Volume 15, Issue 1
1 April 1998
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ISSN
1356-5362
EISSN
1758-812X
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A comparative analysis of interconnection technologies for integrated multilayer inductors
Stephen O’ Reilly
;
John Flannery
;
Terence O’ Donnell
;
Andrew Muddiman
;
Gerard Healy
;
Michael Byrne
;
Sean Cian Ó Mathúna
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for A comparative analysis of interconnection technologies for integrated multilayer inductors
Thin‐film processing on a thick‐film multilayer
Gerhard Klink
;
Andreas Drost
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for Thin‐film processing on a thick‐film multilayer
Current noise of trimmed thick‐film resistors: measurement and simulation
Achim Raab
;
Christian Jung
;
Peter Dullenkopf
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for Current noise of trimmed thick‐film resistors: measurement and simulation
Thermodynamic aspect of the wire‐bonding process
J. Falk
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for Thermodynamic aspect of the wire‐bonding process
Low‐cost fibre‐chip coupling for electro‐optic EMC‐probes
Luc Vanwassenhove
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for Low‐cost fibre‐chip coupling for electro‐optic EMC‐probes
Effects of chip scale package and flip‐chip on the design and manufacturing of electronic products
Petri Savolainen
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for Effects of chip scale package and flip‐chip on the design and manufacturing of electronic products
A five‐layer thin film MCM‐Si design using oxynitride dielectrics
Jo Lernout
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for A five‐layer thin film MCM‐Si design using oxynitride dielectrics
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