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Keywords: AlN layer
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Journal Articles
Muhammad Esmed Alif Samsudin, Yusnizam Yusuf, Norzaini Zainal, Ahmad Shuhaimi Abu Bakar, Christian Zollner, Michael Iza, Steven P. DenBaars
Journal:
Microelectronics International
Microelectronics International (2021) 38 (3): 113–118.
Published: 08 July 2021
...Muhammad Esmed Alif Samsudin; Yusnizam Yusuf; Norzaini Zainal; Ahmad Shuhaimi Abu Bakar; Christian Zollner; Michael Iza; Steven P. DenBaars Purpose The purpose of this study is to investigate the influence of AlN nucleation thickness in reducing the threading dislocations density in AlN layer...
