Keywords: Current–voltage
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Journal Articles
Microelectronics International (2014) 31 (2): 78–85.
Published: 29 April 2014
... electrodes which were designated as source and drain were fabricated on top of individual NWs using conventional lithography electrical and chemical response. Once the trimming process has been completed, the device's currentvoltage (I-V) characteristic was measured by using a Keithley 4200 semiconductor...

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