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Keywords: DP 9K7 characterization
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Journal Articles
Influence of firing process quality on dielectric constant of microwave LTCC substrates
Available to Purchase
Journal:
Microelectronics International
Microelectronics International (2014) 31 (3): 169–175.
Published: 04 August 2014
... distribution inside a box furnace is non-uniform due to specific heat transfer inside the chamber and the way of temperature control. Dielectric permittivity measurement DP 951 characterization DP 9K7 characterization Firing process LTCC technology The effect of co-firing temperature...
