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Keywords: Destruction
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Journal Articles
Journal:
Microelectronics International
Microelectronics International (2001) 18 (2): 16–20.
Published: 01 August 2001
...C. Salame; A. Hoffmann; F. Pelanchon; P. Mialhe; J.P. Charles This article shows that irradiation with neutrons can be used as solution to harden commercial (COTS: Commercial‐Off‐The‐Shelf) n‐channel power MOSFET (Metal Oxide Semiconductor Field Effect Transistor) devices against destructive events...
