Keywords: DoE
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Journal Articles
Microelectronics International (2019) 36 (3): 114–119.
Published: 18 June 2019
... of the lamination pressure does not affect significantly the dielectric parameters of the LTCC substrates. Originality/value This paper shows two aspects of the fabrication of the microfluidic-microwave LTCC devices. First, the resolution of the applied metallization is critical in manufacturing high-frequency...
Journal Articles
Journal Articles
Microelectronics International (2013) 30 (3): 125–133.
Published: 26 July 2013
... of sensor dimensions on sensor response would demand a lot of repetition of the experiment with a different set of input parameters. Hence, DoE methodology was chosen to decrease the number of needed repetitions of the analyses. Influences of seismic mass and beam width were investigated in this work...

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