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Keywords: DoE
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Journal Articles
Impact of process parameters on printing resolution and dielectric properties of LTCC substrate
Available to Purchase
Journal:
Microelectronics International
Microelectronics International (2019) 36 (3): 114–119.
Published: 18 June 2019
... of the lamination pressure does not affect significantly the dielectric parameters of the LTCC substrates. Originality/value This paper shows two aspects of the fabrication of the microfluidic-microwave LTCC devices. First, the resolution of the applied metallization is critical in manufacturing high-frequency...
Journal Articles
Influence of co-firing process condition on low temperature co-fired ceramics membrane deflection
Available to Purchase
Journal:
Microelectronics International
Microelectronics International (2014) 31 (3): 193–200.
Published: 04 August 2014
... Equation 7 Equation 8 Equation 9 Equation 3 © Emerald Group Publishing Limited 2014 LTCC Deformation DoE Membrane Co-firing Taguchi Low temperature co-fired ceramics (LTCC) (Golonka, 2006 ; Thelemann et al., 2002 ; Gongora-Rubio...
Journal Articles
Three axial low temperature cofired ceramic accelerometer
Available to Purchase
Journal:
Microelectronics International
Microelectronics International (2013) 30 (3): 125–133.
Published: 26 July 2013
... parameters. Hence, DoE methodology was chosen to decrease the number of needed repetitions of the analyses. Influences of seismic mass and beam width were investigated in this work, therefore, design PS/DK 32 were applied in the analyses. The design enabledus to estimate statistically...
