Keywords: DoE
Close
Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Journal Articles
Microelectronics International (2019) 36 (3): 114–119.
Published: 18 June 2019
... of the lamination pressure does not affect significantly the dielectric parameters of the LTCC substrates. Originality/value This paper shows two aspects of the fabrication of the microfluidic-microwave LTCC devices. First, the resolution of the applied metallization is critical in manufacturing high-frequency...
Journal Articles
Journal Articles
Microelectronics International (2013) 30 (3): 125–133.
Published: 26 July 2013
... parameters. Hence, DoE methodology was chosen to decrease the number of needed repetitions of the analyses. Influences of seismic mass and beam width were investigated in this work, therefore, design PS/DK 32 were applied in the analyses. The design enabledus to estimate statistically...

or Create an Account

Close Modal
Close Modal