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Keywords: Electrical characterization
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Journal Articles
Journal:
Microelectronics International
Microelectronics International (2018) 35 (1): 12–17.
Published: 02 January 2018
...Rawad Elias; Pierre Ziade; Roland Habchi Purpose The purpose of this paper is to investigate and classify the defects on silicon-based power devices under extreme conditions. Design/methodology/approach Electrical characterization was performed on MOS devices to study their interface defects...
