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Keywords: Electrostatic integrity
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Journal Articles
Journal:
Microelectronics International
Microelectronics International 1–10.
Published: 15 September 2026
... , which exhibits a massive variation of 27.5%, indicating that leakage current is the most critical variability issue. Originality/value It additionally presents one yield based interpretation of the parameter changes due to LER, and shows that electrostatic integrity is one of the critical issues...
