Update search
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
NARROW
Format
Journal
Type
Date
Availability
1-5 of 5
Keywords: Finite element method
Close
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Sort by
Journal Articles
Journal:
Microelectronics International
Microelectronics International 1–16.
Published: 15 July 2026
... only Piezoelectric micromachined ultrasonic transducer (PMUT) Micro-electromechanical systems (MEMS) Bimorph thin film Cantilever beam structure Finite element method Transmission performance Semiconductor technology thick/thin film sensors Natural Science Project of the Henan...
Journal Articles
Journal:
Microelectronics International
Microelectronics International (2026) 43 (3): 121–138.
Published: 11 February 2026
... using the finite element method. The effects of different IMC layer thicknesses on the ability of solder joints to withstand thermal fatigue and life prediction are derived. The ability of solder joints to resist thermal fatigue for different solder compositions is also learned. The research...
Journal Articles
Journal:
Microelectronics International
Microelectronics International (2022) 39 (1): 38–47.
Published: 03 December 2021
... Emerald Publishing Limited Licensed re-use rights only Finite element method Mechanical properties Response surface method Modal testing Electronic devices are prone to expose to a vibrational environment during their service life (Steinberg, 2000). As composite material is extensively...
Journal Articles
Journal:
Microelectronics International
Microelectronics International (2019) 36 (2): 54–61.
Published: 01 March 2019
... to crack issues. This paper aims to study the strength of thin FOWLP because the low package strength may lead to the reliability issue of package crack. Design/methodology/approach This paper uses the experimental method (three-point bending test) and finite element method (ANSYS simulation software...
Journal Articles
Journal:
Microelectronics International
Microelectronics International (1998) 15 (1): 23–31.
Published: 01 April 1998
... bonding and its relation to the materials used will be demonstrated. Adhesion Finite element method Lift‐off Thermodynamics Wire bonding © MCB UP Limited 1998 The temperature signal in Figure 3 is calculated for a 180ms welding process with the assumption that the US power acts...
