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Keywords: Gate pin
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Journal Articles
Analysis of stress relaxation in gate pins of press-pack IGBT devices based on multiphysics coupling
Journal:
Microelectronics International
Microelectronics International (2026) 43 (2): 38–50.
Published: 31 March 2026
...Yuqi Wang; Ran Yao; Hui Li; Wei Lai; Wenqian Yuan; Yirun Ji; Qing Huai; Xi Yuan; Ziyao Jie Purpose This study aims to understand the phenomenon of stress relaxation in the gate pin of press-pack IGBT devices due to the coupling effect of electrical, thermal and mechanical fields, gate pin stress...
