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Keywords: Hysteresis
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Journal Articles
Journal:
Microelectronics International
Microelectronics International (2003) 20 (2): 24–31.
Published: 01 August 2003
... traps, results are quite different, as we have seen. When the trap is localized deeper in the oxide (oxide fixed traps), tunnel effect must be considered even though some defects are influenced by temperature. The complete hysteresis process needs heating and cooling which is time dependent and slow...
