... © Emerald Group Publishing Limited 2006 --> Inspection New IC wafer fault elimination system Keywords: Inspection Envisage Systems the makers of the CAPVIS visual inspection system, have launched a new, low cost wafer inspection system, which enables electronic...

...Z.W. Zhong; Y. Jiang When engineers choose and arrange proper lighting sources for an inspection system, many of them rely on their own experience or guesswork without any guidance of theories. This paper discusses the efficient perception technique, i.e. the Torrance‐Sparrow model and its...

... KS 75: Post-reflow solder joint inspection with inherently low false calls Keywords: Solder, Inspection, Cyberoptics CyberOptics has introduced the KS 75 AOI (automated optical inspection)system for solder joint inspection and component defect detection. KS 75 uses high-resolution...

... and quality assurance in the production of bumped wafers. Datacon's new 8000is 3D inspection system, with its high accuracy and reliability combined with very high throughput, is ideal for this type of automated application. The 8000is analyzes the three-dimensional images used in bump, wire, wafer...

... © MCB UP Limited 2000 --> Datacon Inspection Total solutions for the back end from datacon Keywords: Datacon, Inspection The new 3D inspection system 8000 enables the analysis of three-dimensional image data for bump, wire, wafer and post-bonding inspections...

... © MCB UP Limited 1999 --> MicroJoin Bonding Inspection MicroJoin introduces the 4200 PDI pulsed heat hot bar bonder with powered display inspection Keywords MicroJoin, Bonding, Inspection MicroJoin, Inc., a subsidiary of Palomar Technologies, Inc., introduces...

... New Leica INS 1000 post-electrical test inspection station Keywords Leica, Inspection The new Leica INS 1000 post-electrical test inspection station (PETIS) is an enhanced system for the inspection of whole wafers after electrical testing. The PETIS system allows the direct...

... © MCB UP Limited 1999 --> CyberOptics Inspection Thick film Vantage™ produces 3D scans of thick film Keywords CyberOptics, Inspection, Thick film CyberOptics introduces Vantage, the latest addition to the company's line of CyberScan® inspection systems (Plate 3...