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Keywords: Leica
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Journal Articles
Journal:
Microelectronics International
Microelectronics International (1999) 16 (3)
Published: 01 December 1999
... New Leica INS 1000 post-electrical test inspection station Keywords Leica, Inspection The new Leica INS 1000 post-electrical test inspection station (PETIS) is an enhanced system for the inspection of whole wafers after electrical testing. The PETIS system allows the direct...
