Keywords: Microscopy
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Journal Articles
Journal Articles
Microelectronics International (2007) 25 (1): 46–57.
Published: 28 December 2007
... topographical features which other wise appeared to be hindered in 2D scanning electron microscopy. Design/methodology/approach Surface sensitive techniques, viz. X‐ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) were used. Findings Interfacial adhesion of silver film...

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