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Keywords: Microscopy
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Journal Articles
Journal:
Microelectronics International
Microelectronics International (2010) 27 (3): 148–153.
Published: 03 August 2010
... diffraction rocking curve (HRXRD‐RC), scanning electron microscopy (SEM), energy dispersive X‐ray spectrometry (EDX), and photoluminescence (PL) spectroscopy have been measured on quaternary Alx Iny Ga1−x−y N thin films at room temperature...
Journal Articles
Govind Umarji, Supriya Ketkar, Ranjit Hawaldar, Suresh Gosavi, Kashinath Patil, Uttam Mulik, Dinesh Amalnerkar
Journal:
Microelectronics International
Microelectronics International (2007) 25 (1): 46–57.
Published: 28 December 2007
... topographical features which other wise appeared to be hindered in 2D scanning electron microscopy. Design/methodology/approach Surface sensitive techniques, viz. X‐ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) were used. Findings Interfacial adhesion of silver film...
