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Keywords: Performance trade-offs
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Journal Articles
Journal:
Microelectronics International
Microelectronics International 1–10.
Published: 15 September 2026
... 05 06 2026 15 06 2026 23 06 2026 © 2026 Emerald Publishing Limited 2026 Emerald Publishing Limited Licensed re-use rights only Line edge roughness (LER) 3-Stacked nanosheet FET Statistical variability Yield analysis Performance trade-offs Electrostatic integrity...
