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Keywords: Sensitivity
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Journal Articles
Journal:
Microelectronics International
Microelectronics International (2001) 18 (2): 16–20.
Published: 01 August 2001
... lateral hole current through the base to its contact. 4. 4 The induced base‐emitter voltage resulting from the lateral base current. The four components of the feedback mechanism are illustrated in Figure 2 . © MCB UP Limited 2001 Radiation Hardener Sensitivity Destruction...
