Update search
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
NARROW
Format
Journal
Type
Date
Availability
1-2 of 2
Keywords: Storage
Close
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Sort by
Journal Articles
Hao Chen, Fan Yang, Miguel Pablo Aguirre, Muhammad Asghar Saqib, Galina Demidova, Alecksey Anuchin, Mohamed Orabi, Ryszard Palka, Liudmila Ivanovna Sakhno, Nikolay Vladimirovich Korovkin
Journal:
Microelectronics International
Microelectronics International (2023) 40 (3): 219–231.
Published: 18 May 2023
... 22 07 2022 23 08 2022 12 10 2022 25 12 2022 13 02 2023 © Emerald Publishing Limited 2023 Emerald Publishing Limited Licensed re-use rights only Ocean current energy Storage Switched reluctance generator Full-bridge power converter National Natural...
Journal Articles
Journal:
Microelectronics International
Microelectronics International (2013) 30 (3): 169–175.
Published: 26 July 2013
... grid array (FBGA) package with Cu and Au wire bonds was assembled with green molding compound and substrate. Samples are subjected for long‐term high temperature storage bake test at elevated temperatures of 150°C, 175°C and 200°C. Long‐term reliability plots (lognormal plots) are established...
