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1-6 of 6
Keywords: Stress (materials)
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Journal Articles
Journal:
Microelectronics International
Microelectronics International (2013) 30 (1): 14–18.
Published: 18 January 2013
... for the manufacturers. The components also need to withstand higher soldering temperatures (typically 20‐35°C higher) and the solder joints should have at least the same life time as the conventional solder balls (expressed in number of thermal cycles). Stress (materials) Finite element analysis ABAQUS Thermal...
Journal Articles
Journal:
Microelectronics International
Microelectronics International (2012) 29 (3): 163–171.
Published: 27 July 2012
... can be contacted at: sungyi@cecs.pdx.edu © Emerald Group Publishing Limited 2012 Stress (materials) Thermal expansion Plastics Microelectronics packaging Ball grid arrays During a manufacturing process of microelectronic devices, these devices have become susceptible to defects...
Journal Articles
Journal:
Microelectronics International
Microelectronics International (2011) 28 (1): 17–28.
Published: 25 January 2011
... analysis Surface fitting Soldering Joining processes Stress (materials) To reduce the cost and process or product development time and to improve reliability performance, integrated design for reliability (DFR) at the earlier stage of product development has become a vital practice...
Journal Articles
Journal:
Microelectronics International
Microelectronics International (2005) 22 (2): 35–37.
Published: 01 August 2005
... information concerning a very important field in microelectronic devices where the switching speed of the components becomes a major requirement. The technique used to improve the device speed has a very low cost and a simple feasibility. © Emerald Group Publishing Limited 2005 Stress (materials...
Journal Articles
Journal:
Microelectronics International
Microelectronics International (2005) 22 (1): 34–42.
Published: 01 April 2005
... prediction of the materials. Stress (materials) Deformation Electronics industry Packaging © Emerald Group Publishing Limited 2005 The deformation fields resulting from the DIC processing show interesting distributions in the assembly of the BGA package. Both the horizontal displacement...
Journal Articles
Journal:
Microelectronics International
Microelectronics International (2004) 21 (2): 16–22.
Published: 01 August 2004
... Stress (Materials) Vertical double‐diffused metal oxide semiconductor (VDMOS) transistors are the most commercially advanced devices evolved from MOS integrated‐circuit technology. For switching power applications, VDMOS transistors are attractive since, in unipolar devices, there is no storage...
