Update search
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
NARROW
Format
Journal
Type
Date
Availability
1-5 of 5
Keywords: Thermal cycling
Close
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Sort by
Journal Articles
Journal:
Microelectronics International
Microelectronics International (2026) 43 (3): 121–138.
Published: 11 February 2026
...Xuexia Yang; Miao Zhu; Yanxi Sun; Jinbao Lin; Xin Hao; Xuefeng Shu; Gesheng Xiao Purpose The purpose of this study is to investigate the influence of intermetallic compound ( IMC ) layer thickness on the reliability of plastic ball grid array ( PBGA ) lead-free solder joints under thermal cycling...
Journal Articles
Shaoyi Liu, Songjie Yao, Song Xue, Benben Wang, Hui Jin, Chenghui Pan, Yinwei Zhang, Yijiang Zhou, Rui Zeng, Lihao Ping, Zhixian Min, Daxing Zhang, Congsi Wang
Journal:
Microelectronics International
Microelectronics International (2023) 40 (2): 140–151.
Published: 12 January 2023
... properties of SMT solder joint under thermal cycling load and random vibration load were solved by 3D finite element analysis. The fatigue life of SMT solder joint under different loads can be calculated by using the modified Coffin–Manson model and high-cycle fatigue model. Findings The results revealed...
Journal Articles
Journal:
Microelectronics International
Microelectronics International (2012) 29 (1): 15–21.
Published: 20 January 2012
... Reliability modelling Thermal cycling High density chip scale package discussed in this article is a substrate‐less chip packaging technology that offers a low cost package with high density and high performance. In the package construction, silicon chips are arranged then encapsulated in the panel...
Journal Articles
Journal:
Microelectronics International
Microelectronics International (2012) 29 (1): 47–57.
Published: 20 January 2012
...Dhafer Abdul Ameer Shnawah; Mohd Faizul Bin Mohd Sabri; Irfan Anjum Badruddin; Suhana Said Purpose The purpose of this paper is to discuss the reliability of board level Sn‐Ag‐Cu (SAC) solder joints in terms of both thermal cycling and drop impact loading conditions, and further modification...
Journal Articles
Journal:
Microelectronics International
Microelectronics International (2000) 17 (1): 8–12.
Published: 01 April 2000
...Milos Dusek; Ivan Szendiuch; Petr Szuscik Investigates the influence of land pattern pad designs and solder volume on reliability of solder joint attachments for surface mounted passive chip devices. All boards were thermal cycled and periodically tested to induce a damage mechanism in less time...
