Update search
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
NARROW
Format
Journal
Type
Issue Section
Date
Availability
1-3 of 3
Keywords: X-rays
Close
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Sort by
Journal Articles
Journal:
Microelectronics International
Microelectronics International (2011) 28 (3): 3–6.
Published: 02 August 2011
... for 1 h deprived of any catalysts. Findings These ZnO samples were studied by scanning electron microscopy, high‐resolution X‐ray diffraction (HR‐XRD), and photoluminescence (PL) spectroscopy. Atomic force microscope (AFM) images were applied to ascertain surface morphology of produced ZnO...
Journal Articles
Govind Umarji, Supriya Ketkar, Ranjit Hawaldar, Suresh Gosavi, Kashinath Patil, Uttam Mulik, Dinesh Amalnerkar
Journal:
Microelectronics International
Microelectronics International (2007) 25 (1): 46–57.
Published: 28 December 2007
... topographical features which other wise appeared to be hindered in 2D scanning electron microscopy. Design/methodology/approach Surface sensitive techniques, viz. X‐ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) were used. Findings Interfacial adhesion of silver film...
Journal Articles
Journal:
Microelectronics International
Microelectronics International (2004) 21 (3)
Published: 01 December 2004
... © Emerald Group Publishing Limited 2004 --> X-rays New 2D/3D X-ray inspection system with digital imaging capability Keywords: X-rays FEINFOCUS announces the μCT-FOX 2D/3D X-ray inspection system with new direct digital detector (DDD) imaging (Plate 3...
