MV Technology launches new FX-B benchtop measurement system
MV Technology launches new FX-B benchtop measurement system
Keywords: MV Technology, Measurement
MV Technology Ltd has launched the new FX-B bench-top flux inspection and measurement system for process set-up or off-line process control for BGA, CSP or flip chip flux component manufacturing.
The FX-B is a compact version of the market – proven FX-10, and utilizes the patent-pending UV fluorescence intensity mapping (UV FIM) process to produce a digital image of the flux deposits on a substrate. This image is obtained and analyzed by a computer to map the topographical details of each deposit.
The FX-B contains a complete imaging system that enables users to manually place substrates onto the viewing tray and obtain intensity-mapped images of flux deposits to determine:
area coverage of pads;
volume of deposits;
height of deposits;
deformed deposits;
placement offsets of each deposit.
Options include:
SPC toolkit;
2D solder paste measurement;
2D solder ball measurement.
This flexible bench-top unit can be used in multiple modes. Manual; the inspection is limited to a user-defined rectangular area within the image. Semi-automatic; areas of interest can be highlighted using the GUI and stored into a file for subsequent inspections. Automatic; CAD data minimizes setup and teaching time.
For further information: Tel: +3531 6718177; Fax: +3531 671 8470; E-mail: marketing@mvt.ie; Web site: http://www.mvt.ie
