The initial excitement over increased solder joint densities, higher manufacturing throughput, and superior electrical performance brought forth by surface mount technology (SMT) has been replaced by frustrations over lower yields and the inherent difficulties of inspecting hidden solder joints. In the plated through hole (PTH) process, rework and inspection tasks were not only relatively easier tasks, but also less costly. The high cost of inspecting and reworking SMT assemblies dictates a rethinking of the assembly process. Increasing first time yields becomes the key to reducing SMT inspection and rework costs. In a high volume facility, a 100% visual inspection process is not feasible because of the high cost of inspection and rework. However, if a company intends to remain competitive, inspection and rework must be reduced without a sacrifice to final product quality. Realising that it is not possible to ‘inspect’ quality into a product, improved yield must result from a controlled process environment. By maintaining a controlled environment, one will be provided with lower inspection costs, lower rework costs, lower scrap and, in the final analysis, improved product quality. At the heart of any process control environment should be a real‐time process control system designed specifically to accommodate SMT process defects. Process monitoring is accomplished by locating and identifying SMT process flaws. These flaws will then be reported to a host system for statistical analysis. These are statistical data used to make timely adjustments to the various stages of the assembly process in a real‐time manner. Being able to monitor the production process objectively in real time, and detect hidden flaws accurately, are the keys to having a successful process inspection system. Automated X‐ray Inspection is gaining acceptance as a viable process monitoring tool, capable of detecting and reporting SMT process flaws, including those hidden flaws not reported with typical visual inspection systems. The purpose of this paper is to show how an Automated X‐ray Inspection system can be integrated into the SMT production process as a cost‐effective method for improving SMT yield.
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1 January 1989
Review Article|
January 01 1989
How to Use Automated X‐ray Inspection for Process Monitoring and Control
R. Nameth
R. Nameth
Nicolet Instrument Corporation, Madison, Wisconsin, USA
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Publisher: Emerald Publishing
Online ISSN: 1758-6836
Print ISSN: 0954-0911
© MCB UP Limited
1989
Soldering & Surface Mount Technology (1989) 1 (1): 47–51.
Citation
Nameth R (1989), "How to Use Automated X‐ray Inspection for Process Monitoring and Control". Soldering & Surface Mount Technology, Vol. 1 No. 1 pp. 47–51, doi: https://doi.org/10.1108/eb037663
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