Two types of Plastic ball Grid array packages, a 225‐lead full matrix array and a 256‐lead perimeter array, were subjected to 168 hours of moisture preconditioning at 85°C and 30% relative humidity followed by simulated infra‐red reflow at temperature ramp rates of 1°C/s and 0.67°C/s. The packages were subsequently examined for delamination and cracking using scanning acoustic microscopy and environmental scanning electron microscopy. At the higher ramp rate, delamination and cracking were observed in both package types, originating in the die attach and propagating along the weakest interfaces. At the lower ramp rate, a small amount of delamination was observed. This suggests that there is a critical ramp rate below which popcorn cracking does not occur.
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1 April 1996
Research Article|
April 01 1996
Popcorning in Fully Populated and Perimeter Plastic Ball Grid Array Packages*
R. Munamarty;
R. Munamarty
CALCE Electronic Packaging Research Center, University of Maryland, Collage Park, Maryland, USA
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P. McCluskey;
P. McCluskey
CALCE Electronic Packaging Research Center, University of Maryland, Collage Park, Maryland, USA
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M. Pecht;
M. Pecht
CALCE Electronic Packaging Research Center, University of Maryland, Collage Park, Maryland, USA
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L. Yip
L. Yip
VLSI Technology Inc, San Jose, California, USA
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Publisher: Emerald Publishing
Online ISSN: 1758-6836
Print ISSN: 0954-0911
© MCB UP Limited
1996
Soldering & Surface Mount Technology (1996) 8 (1): 46–50.
Citation
Munamarty R, McCluskey P, Pecht M, Yip L (1996), "Popcorning in Fully Populated and Perimeter Plastic Ball Grid Array Packages*". Soldering & Surface Mount Technology, Vol. 8 No. 1 pp. 46–50, doi: https://doi.org/10.1108/09540919610777591
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