GenRad improves performance and efficiency; cuts costs in GR TestStation systems
GenRad improves performance and efficiency; cuts costs in GR TestStation systems
Keywords: GenRad, Testing
GenRad, Inc. have introduced three improvements to its GR TestStation platform. The advancements are designed to significantly improve electronics production line performance and efficiency while cutting manufacturing costs.
The innovations are focused around GenRad's new pin electronics that can both drive and sense at the accuracy that is required to test today's low voltage electronic components. The new pin electronics will be featured on all hybrid pin boards, the key modules in the GR TestStation in-circuit test systems.
Significant new features of the hybrid pin boards are increased logic levels,backdrive monitoring, and programmable slew rates. These unique GenRad product capabilities allow electronics manufacturers to:
double their production line test accuracy;
reduce production time and manufacturing costs; and
put more power and control in the hands of test programmers.
With pin voltages that have twice the accuracy of previous pin electronics,the new technology has the ability to address modern devices with multiple logic families up to 26 per device, with the correct input and sense voltages. By increasing the available logic levels from two to 26, GR TestStation offers the flexibility to generate high-accuracy tests for a wide spectrum of components.
As the bus structure on the latest products uses 64-bit and 128-bit buses,control over the backdriving currents that flow through the device is essential. Faulty components can generate unpredictable backdrive currents – GR TestStation users will now have the capability to monitor and control backdrive on a per-pin basis, putting more power and control in the hands of the test programmer.
The new pin electronics can measure the backdrive current in the program development phase and continually monitor current and time during the test execution, to prevent damage and unpredictable behavior in faulty board conditions. The ability to measure backdrive currents also allows the programmer to guarantee test stability, with guaranteed tri-state conditions.
In addition to multiple logic levels and backdrive monitoring, the new TestStation features programmable slew rates for improved test stability;over-voltage protection that prevents damage to the hybrid pin board; and short circuit current checking that prevents damage to both the unit under test and the GR TestStation system.
Further information is available from Europe and Asia, Renate Fritz,Director. Tel: +49 89 962 85 303; Fax: +49 89 962 85 301; E-mail: Fritzr@genrad.com
