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Keywords: Structure
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Journal Articles
Journal:
World Journal of Engineering
World Journal of Engineering (2022) 19 (6): 788–793.
Published: 05 July 2021
... been deposited on Si(100), on thin film buffer layer of Pt and glass substrates. X-ray diffraction (XRD) was used to analyze structure of the films, which possesses a good structure with (0010) preferred orientation. Electronic behavior of the samples has been studied. Design/methodology/approach...
