Micro‐Electronic Components Failure Rate Data Comparison Available to Purchase

The available failure rate sources are compared. Models require repeatability to be valid. Whereas the parameters and conditions of Boyle's law enjoy this feature, failure rate models are not so constrained. Hence wide ranges apply when comparing data sources. These ranges are wide compared with the acceptable tolerances for failure rate predictions. It is argued that a simple failure model, as depicted in Table IV, is justified by the foregoing.