... the idiosyncrasies in semiconductor manufacturing such as the high outgoing quality level, the repetitive testing environment, the high coefficient of variation in the number of failure products, and the testing capacity constraint. Conducting extensive computational experiments, the authors demonstrate...

.... This procedure is useful for statistical process control in many industrial applications. Research limitations/implications The results may be applied in a semiconductor manufacturer. Originality/value The Exponentiated‐Weibull‐Arrhenius model has never before been used to plan an ALT. Let T≥0...

... condition, and the other to forecast the system’s response value. A measuring system employed in semiconductor manufacturing demonstrates the proposed approach’s effectiveness. According to those results, the proposed approach outperforms the conventional Taguchi method. By using the proposed approach...

...M. Meniconi Posits that most modern electronic equipment, particularly those involving metal‐oxide‐semiconductor technologies, are susceptible to electric overstresses which can cause performance degradation and lead to equipment failure. Probably the most problematic of these stresses is known...

...D.M. Barry; M. Meniconi; M. Al-Ghazi © Emerald Group Publishing Limited 1993 CANADA RADIATION SEMICONDUCTORS TESTS IJQRM 10,7 16 Reliability Degradation in NMOS Devices Subjected to High Energy Gamma-Ray Irradiation D.M. Barry and M. Meniconi Lakehead University, Ontario, and M...