...Imad H. Khamis; James J. Higgins An alternative is proposed to the Weibull cumulative exposure model in step‐stress testing, that we call the transformed exponential model. The proposed model comes from a natural transformation of the exponential cumulative exposure model. It is as flexible...

... product reliability, namely reliability demonstrating testing, and presents its numerous shortcomings and deficiencies. Analyses the results of performing reliability demonstration testing on eight products which support the viewpoint that it is no longer appropriate. Proposes a SURGE (stress unveiled...

... than the time‐consuming and costly procedures of physical failure analysis. In addition, draws a comparison between the functional tests and the parametric tests. The data were obtained by stressing statistical samples of TMS2114L NMOS static RAMs to varying total doses of ionizing radiation. Presents...

...Imad H. Khamis Compares optimum constant‐stress and simple step‐stress ALTs for the Weibull distribution. The purpose is to quantify the advantage of using step‐stress testing in comparison to constant‐stress testing when censoring is likely to occur at the lower levels of stress. Assumes...

...G.A. Bohoris Summarizes part of the work carried out to date on seeking analytical solutions to the two‐sample problem with censored data in the context of reliability and maintenance optimization applications. For this purpose, reviews non‐parametric two‐sample tests for censored data and details...

... of a product being defective is high in the infant stage and where early removal of defects will improve reliability in service. Studies economic designs of stress screening plans where every finished product is subject to burn‐in. Examines the optimal burn‐in time in minimizing total testing, manufacturing...

...P.A.C. Miguel; T.G. King Due to the increase in the use and importance of co‐ordinate measuring machines (CMM) in manufacturing systems, it is necessary to develop reliable and accurate performance tests for their verification to assure the quality of manufactured components. Presents general...

...G.A. Bohoris Summarizes part of the work carried out to date on the two‐sample problem with censored data in the context of reliability and maintenance optimization applications. For this purpose, non‐parametric two‐sample tests for censored data are discussed and their regular usage in common...

...Jussi K. Vaurio Solving an optimal test or inspection interval is a relevant problem for a machine that is subject to random failures when failures can only be revealed by periodic inspection or testing. Frequent testing increases the testing costs, while infrequent testing leads to increasing...

...D.M. Barry; M. Meniconi; M. Al-Ghazi © Emerald Group Publishing Limited 1993 CANADA RADIATION SEMICONDUCTORS TESTS IJQRM 10,7 16 Reliability Degradation in NMOS Devices Subjected to High Energy Gamma-Ray Irradiation D.M. Barry and M. Meniconi Lakehead University, Ontario, and M...

...C. Lawrence The central issues are listed that affect the implementation of a short‐term test technique that is intended to make the routine quality checks of production of components in plastic pipes that are expected to have a service life of 50 to 60 years. It is concluded that, in view...