...George N Kenyon; R. Samual Sale; Kurt Hozak; Paul Chiou Purpose – The purpose of this paper is to develop an yield-based process capability index (PCI), C_py, to overcome the shortcomings of existing PCIs that limit their use and lead to inaccurate measures of quality...

... is investigated using established yield models. The cost in terms of gross margin degradation of yield loss at final test to extensive screening and aggressive limits is modelled. Findings The paper finds that to maintain ship PPM very high levels of test coverage are required – typically test coverage needs...