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Farazila B. Yusof
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Journal Articles
3-pass and 5-pass laser grooving & die strength characterization for reinforced internal low-k 55nm node wafer structure via heat-treatment process
Available to PurchaseMuhammad Hakeem Mohammad Nazri, Tan Chou Yong, Farazila B. Yusof, Gregory Soon How Thien, Chan Kah Yoong, Yap Boon Kar
Journal:
Microelectronics International
Microelectronics International (2024) 41 (4): 186–195.
Published: 31 May 2024
