Keywords: TCR
Close
Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Journal Articles
Microelectronics International (2017) 34 (3): 154–159.
Published: 07 August 2017
... metallization on its electric parameters and structure. On the basis of the research conducted, the existence of a relationship between resistance (R) and the temperature coefficient of resistance (TCR) of the test structure with a Ni-P alloy-based layer and the temperature of stabilization was proposed...
Journal Articles

or Create an Account

Close subscription notice
Close access options