Keywords: Thermal testing
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Journal Articles
Journal Articles
Microelectronics International (2001) 18 (3): 9–14.
Published: 01 December 2001
... MCB UP Limited 2001 Thermal testing Integrated circuits One of the main issues in microelectronics at the end of the twentieth century and beginning of the twenty‐first is increasing of the speed of data transfer and processing. The 1997 National Technology Roadmap for Semiconductors...
Journal Articles
Microelectronics International (2000) 17 (2): 7–10.
Published: 01 August 2000
... behaviour are dependent on board structure or resistor position Printed circuit boards Simulation Thermal testing Resistors Heat There are many advantages associated with embedding circuit components such as resistors (Blanco and Mansingh, 1989), capacitors (Liu et al., 1999...
Journal Articles
Microelectronics International (1999) 16 (2)
Published: 01 August 1999
... © MCB UP Limited 1999 --> Schlumberger Semiconductors Thermal testing Schlumberger introduces ETC 1000 for breakthrough precision in test site thermal control Keywords Schlumberger, Semiconductors,Thermal testing Schlumberger introduces today the ETC 1000...
Journal Articles
Microelectronics International (1997) 14 (2): 8–10.
Published: 01 August 1997
... addresses thermal testing, and more specifically thermal transient testing. © MCB UP Limited 1997 Thermal testing Testing Electronic packaging Microelectronics Production faults or field faults affecting ICs or their package may have thermal consequences, even in cases where...

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