Keywords: Thermal testing
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Journal Articles
Journal Articles
Microelectronics International (2001) 18 (3): 9–14.
Published: 01 December 2001
... computation with analytic method. It can be helpful for determination of the temperature of the chip during unsteady state in any point of the chip, average temperature and thermal time constant of the substrate. © MCB UP Limited 2001 Thermal testing Integrated circuits One of the main...
Journal Articles
Microelectronics International (2000) 17 (2): 7–10.
Published: 01 August 2000
... application. In the light of this variability simulations have been carried out on two PCB structures, both of which are in common use. These structures are illustrated in Figure 2 . Printed circuit boards Simulation Thermal testing Resistors Heat The general technique of superposition...
Journal Articles
Microelectronics International (1999) 16 (2)
Published: 01 August 1999
... © MCB UP Limited 1999 --> Schlumberger Semiconductors Thermal testing Schlumberger introduces ETC 1000 for breakthrough precision in test site thermal control Keywords Schlumberger, Semiconductors,Thermal testing Schlumberger introduces today the ETC 1000...
Journal Articles
Microelectronics International (1997) 14 (2): 8–10.
Published: 01 August 1997
... addresses thermal testing, and more specifically thermal transient testing. (i) They result only in a rough model (e.g., three RC stages) of the structure. (ii) The parameter identification for these models involves a manual and Intuitive step (splitting the response into regions in relation...

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