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Keywords: X‐ray analysis
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Journal Articles
Journal:
Microelectronics International
Microelectronics International (2011) 28 (2): 44–48.
Published: 10 May 2011
.../methodology/approach AlxGa1−xN thin films with wurtzite structure in the composition range of 0≤x≤1 are used in this study. The compositions of the samples are calculated using Vegard's law and verified by energy dispersive X‐ray analysis. The samples...
Journal Articles
Journal:
Microelectronics International
Microelectronics International (2010) 27 (3): 148–153.
Published: 03 August 2010
...) of the AlxGa1−xN and six AlxInyGa1−x−yN quaternary samples M.A. Abid can be contacted at: muslim_abid@yahoo.com © Emerald Group Publishing Limited 2010 Alloys Microscopy Epitaxy X‐ray analysis...
