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Journal Articles

Unsupervised representation learning for wafer defect recognition

Sheng Geng, Feng Wang, Huaping Liu

Robotic Intelligence and Automation (2025) 45 (4): 481–493.

https://doi.org/10.1108/RIA-04-2023-0043

Published: 27 June 2025

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Journal Articles

An end-to-end learning method for industrial defect detection

Yupei Wu, Di Guo, Huaping Liu, Yao Huang

Assembly Automation (2020) 40 (1): 31–39.

https://doi.org/10.1108/AA-08-2018-114

Published: 30 September 2019

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Journal Articles

Proximity query based on second order cone programming using convex superquadrics: a static collision detection algorithm for narrow-phase

Lin Chen, Chongqi Ni, Junjie Feng, Jun Dai, Bingqiong Huang, Huaping Liu, Haihong Pan

Assembly Automation (2015) 35 (4): 367–375.

https://doi.org/10.1108/AA-03-2015-018

Published: 07 September 2015

View article titled, Proximity query based on second order cone programming using convex superquadrics: a static collision detection algorithm for narrow-phase

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