– The purpose of this paper is to determine the influence of mechanical factors (such as longitudinal elongation or cyclic compressive and tensile stresses) on electrical properties of thin- or thick-film resistors or conductors.
– All test samples were made on Kapton foil. Copper foil or silver-based polymer thick-film conductive inks were used for fabrication of conductors. Resistive structures were made with the aid of two polymer thick-film resistive inks or OhmegaPly Ni-P resistive foil. Test structures differ not only in materials applied for resistors or conductors but also in geometrical shape of functional tracks (meanders consisted of many horse-shoes, semicircles, squares or triangles).
– Presented results showed significant role of material on range of reversible resistance changes. But shape of test samples also affects relation between relative resistance changes and relative elongation.
– In general, changes induced by cyclic compressive and stretching stresses were smaller than those caused by substrate elongation.
