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Keywords: Application-specific integrated circuit
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Journal Articles
Journal:
World Journal of Engineering
World Journal of Engineering (2014) 11 (3): 279–286.
Published: 01 June 2014
...Mansour Assaf; Leslie-Ann Moore; Sunil Das; Satyendra Biswas; Scott Morton A low-level logic fault test simulation environment targeted towards application-specific integrated circuits (ASICs) in particular is proposed in this paper. The simulation environment emulates a typical built-in self...
