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Keywords: Built-in self-testing in very large scale integration
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Journal Articles
Journal:
World Journal of Engineering
World Journal of Engineering (2013) 10 (3): 283–296.
Published: 01 September 2013
...Sunil Das; Alexander Applegate; Satyendra Biswas; Emil Petriu The design of aliasing-free space support hardware for built-in self-testing in very large scale integration circuits and systems is of immense significance, specifically due to the design paradigm shift in recent years from system...
Journal Articles
Journal:
World Journal of Engineering
World Journal of Engineering (2012) 9 (3): 199–206.
Published: 01 June 2012
...Sunil Das; Satyendra Biswas; Voicu Groza; Mansour Assaf Realizing aliasing-free space compressor for built-in self-testing of very large scale integration circuits and systems is of immense practical significance, especially due to the design paradigm shift in recent years from system-on-board...
