Keywords: Built-in self-testing in very large scale integration
Close
Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Journal Articles
World Journal of Engineering (2013) 10 (3): 283–296.
Published: 01 September 2013
...Sunil Das; Alexander Applegate; Satyendra Biswas; Emil Petriu The design of aliasing-free space support hardware for built-in self-testing in very large scale integration circuits and systems is of immense significance, specifically due to the design paradigm shift in recent years from system...
Journal Articles
World Journal of Engineering (2012) 9 (3): 199–206.
Published: 01 June 2012
...Sunil Das; Satyendra Biswas; Voicu Groza; Mansour Assaf Realizing aliasing-free space compressor for built-in self-testing of very large scale integration circuits and systems is of immense practical significance, especially due to the design paradigm shift in recent years from system-on-board...

or Create an Account

Close Modal
Close Modal