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Keywords: Module under test (MUT)
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Journal Articles
Implementing built-in self-test environment for cores-based digital circuits with Verilog HDL
Available to Purchase
Journal:
World Journal of Engineering
World Journal of Engineering (2012) 9 (6): 519–528.
Published: 01 December 2012
...-based systems Module under test (MUT) Response compaction unit (RCU) Assaf M. H., 2003. Digital core output test data compression architecture based on switching theory concepts. Ph.D. dissertation, University of Ottawa, Ottawa, ON, Canada. Das S. R., 1973. On a new approach for finding...
