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Keywords: test pattern generator
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Journal Articles
Journal:
World Journal of Engineering
World Journal of Engineering (2014) 11 (3): 279–286.
Published: 01 June 2014
...-testing (BIST) environment with test pattern generator (TPG) that sends its outputs to a circuit (core) under test (CUT) and the output streams from the CUT are fed into an output response analyzer (ORA). The developed simulator is very suitable for testing embedded digital intellectual property (IP...
