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Journal Articles

Effects of Rework on the Reliability of Pin Grid Array Interconnects

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J. Lau, S. Leung, R. Subrahmanyan, D. Rice, S. Erasmus, C.Y. Li
Journal: Circuit World
Circuit World (1991) 17 (4): 5–10.
https://doi.org/10.1108/eb046140
Published: 01 March 1991
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