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Tanu Gupta
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Journal Articles
Copula based constant-stress PALT using tampered failure rate model with dependent competing risks
Available to Purchase
International Journal of Quality & Reliability Management (2019) 36 (4): 510–525.
Published: 12 February 2019
Journal Articles
Optimum modified ramp-stress ALT plan with competing causes of failure
Available to Purchase
International Journal of Quality & Reliability Management (2017) 34 (5): 733–746.
Published: 02 May 2017
