Teradyne expands the INTEGRA J750 family of test systems

Teradyne expands the INTEGRA J750 family of test systems

Keywords: Teradyne, Testing

Teradyne's Integra Test Division have announced the new J750k test system with an entry level price of $99,000. The J750k, an expansion of the successful INTEGRA J750 family of test systems, offers the lowest cost of test for low-end semiconductor devices. The J750k was designed specifically to reduce the cost of test without compromising production efficiency, flexibility or reliability. Available now, the J750k basic configuration starts with 64 pins at 33MHz and can be expanded up to 256 pins at 66MHz. As test requirements increase, the system may be upgraded to higher pin counts and speed with field hardware and software upgrades. The J750k may also be configured with system options, like the mixed-signal or memory test options, to address the variation of testing needs.

Further details: www.teradyne.com